Reduction of interface traps at the...

Reduction of interface traps at the amorphous-silicon/crystalline-silicon interface by hydrogen and nitrogen annealing

Alnuaimi, Aaesha, Islam, Kazi, Nayfeh, Ammar
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Volume:
98
Language:
english
Journal:
Solar Energy
DOI:
10.1016/j.solener.2013.10.003
Date:
December, 2013
File:
PDF, 1.18 MB
english, 2013
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