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Microcrystalline parameters in annealed Bivoltine silk fibres using wide-angle X-ray scattering
R. Somashekar, R. Gopalkrishne ursVolume:
36
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0032-3861(95)91445-d
File:
PDF, 410 KB
english, 1995