Temperature dependent model for threshold voltage and...

Temperature dependent model for threshold voltage and subthreshold slope of strained-Si channel MOSFETs with a polysilicon gate

Biswas, Abhijit, Bhattacherjee, Swagata
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.03.009
Date:
August, 2014
File:
PDF, 705 KB
english, 2014
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