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Observation of damage in insulated copper cables by THz imaging
Takahashi, Seiya, Hamano, Tomoyuki, Nakajima, Kaori, Tanabe, Tadao, Oyama, YutakaVolume:
61
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2013.10.004
Date:
January, 2014
File:
PDF, 869 KB
english, 2014