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Hafnium, cadmium and indium impurities in 4H-SiC observed by perturbed angular correlation spectroscopy
Licht, T., Achtziger, N., Forkel-Wirth, D., Freitag, K., Grillenberger, J., Kaltenhäuser, M., Reislöhner, U., Rüb, M., Uhrmacher, M., Witthuhn, W.Volume:
6
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(97)00071-X
Date:
August, 1997
File:
PDF, 453 KB
english, 1997