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Correlation between structure and semiconductor-to-metal transition characteristics of VO2/TiO2/sapphire thin film heterostructures
Bayati, M.R., Molaei, R., Wu, F., Budai, J.D., Liu, Y., Narayan, R.J., Narayan, J.Volume:
61
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2013.09.019
Date:
December, 2013
File:
PDF, 2.43 MB
english, 2013