Reliability assessment of CMOS differential cross-coupled...

Microelectronics Reliability 2014 / 02 Vol. 54; Iss. 2

Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena

Afacan, Engin, Dundar, Gunhan, Baskaya, Faik
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.08.013
Date:
February, 2014
File:
PDF, 832 KB
english, 2014
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