Electrical properties and resonance scattering in heavily...

Electrical properties and resonance scattering in heavily doped semiconductors

Donald Long, J.David Zook, P.W. Chapman, O.N. Tufts
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Volume:
2
Year:
1964
Language:
english
Pages:
5
DOI:
10.1016/0038-1098(64)90286-8
File:
PDF, 345 KB
english, 1964
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