Limitations of Near Edge X-ray Absorption Fine Structure as...

Limitations of Near Edge X-ray Absorption Fine Structure as a tool for observing conduction bands in chalcopyrite solar cell heterojunctions

Johnson, Benjamin, Klaer, Jo, Merdes, Saoussen, Gorgoi, Mihaela, Höpfner, Britta, Vollmer, Antje, Lauermann, Iver
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Volume:
190
Language:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2013.01.007
Date:
October, 2013
File:
PDF, 909 KB
english, 2013
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