Effect of sample imperfections on far-field...

Effect of sample imperfections on far-field self-diffraction patterns of a Gaussian beam passing through Kerr media

Gu, Bing, Cui, Yiping
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Volume:
124
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2013.05.144
Date:
December, 2013
File:
PDF, 1.54 MB
english, 2013
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