Electrical and calorimetrical analyses of memory phenomenon...

Solid State Communications 1970 Vol. 8; Iss. 17

Electrical and calorimetrical analyses of memory phenomenon in amorphous semiconductors

Kazunobu Tanaka, Sigeru Iizima, Michio Sugi, Yasumasa Okada, Makoto Kikuchi
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Volume:
8
Year:
1970
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(70)90036-0
File:
PDF, 283 KB
english, 1970
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