Lateral displacement in soft-landing process and electronic...

Lateral displacement in soft-landing process and electronic properties of size-selected Pt7 clusters on the aluminum oxide film on NiAl(110)

Beniya, Atsushi, Isomura, Noritake, Hirata, Hirohito, Watanabe, Yoshihide
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Volume:
576
Language:
english
Journal:
Chemical Physics Letters
DOI:
10.1016/j.cplett.2013.05.033
Date:
June, 2013
File:
PDF, 1.11 MB
english, 2013
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