Model dielectric function analysis of the critical point...

Thin Solid Films 2013 / 08 Vol. 541

Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range

Agocs, Emil, Nassiopoulou, Androula G., Milita, Silvia, Petrik, Peter
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Volume:
541
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.10.126
Date:
August, 2013
File:
PDF, 488 KB
english, 2013
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