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Evaluation of the wafer polishing pad capacity and lifetime in the machining of reliable elevations
Lee, Eun-Sang, Cha, Ji-Wan, Kim, Seong-HyunVolume:
66
Language:
english
Journal:
International Journal of Machine Tools and Manufacture
DOI:
10.1016/j.ijmachtools.2012.11.003
Date:
March, 2013
File:
PDF, 2.09 MB
english, 2013