The ellipsometrical method for the determination of the...

The ellipsometrical method for the determination of the thickness and the dispersion of the optical constants of thin absorbing films evaporated on metal substrates

I.N. Shklyarevskii, A.F.A. El-Shazly, V.P. Kostyuk
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Volume:
10
Year:
1972
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(72)90892-7
File:
PDF, 251 KB
english, 1972
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