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The ellipsometrical method for the determination of the thickness and the dispersion of the optical constants of thin absorbing films evaporated on metal substrates
I.N. Shklyarevskii, A.F.A. El-Shazly, V.P. KostyukVolume:
10
Year:
1972
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(72)90892-7
File:
PDF, 251 KB
english, 1972