Secondary electron emission spectroscopy and total electron...

Diamond and Related Materials 1992 / 4 Vol. 1; Iss. 5-6

Secondary electron emission spectroscopy and total electron yield measurements for the assessment of near-surface damage in diamond

Hoffman, A., Prawer, S., Kalish, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/0925-9635(92)90143-C
Date:
April, 1992
File:
PDF, 344 KB
english, 1992
Conversion to is in progress
Conversion to is failed