Concurrent and comparative fault simulation in SystemC and its application in robustness evaluation
Lu, Weiyun, Radetzki, MartinVolume:
37
Language:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2012.09.005
Date:
March, 2013
File:
PDF, 2.12 MB
english, 2013