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Non-destructive testing of materials by microwave ellipsometry methods
Tsitsikas, Dimitris A., Gallinella, Giorgio, Patel, Sneha, Seligman, Henry, Greaves, Paul, Amos, Roger J.Volume:
27
Language:
english
Journal:
NDT & E International
DOI:
10.1016/0963-8695(94)90293-3
Date:
December, 1994
File:
PDF, 140 KB
english, 1994