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Analysis of the relationship between the kink effect and the indium levels in MOS transistors
Hizem, N., Fargi, A., Kalboussi, A., Souifi, A.Volume:
178
Language:
english
Journal:
Materials Science and Engineering: B
DOI:
10.1016/j.mseb.2013.09.008
Date:
December, 2013
File:
PDF, 1.83 MB
english, 2013