Sensitivity-based investigation of threshold voltage...

Solid-State Electronics 2013 / 6 Vol. 84

Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells and MOSFETs

Bonfiglio, Valentina, Iannaccone, Giuseppe
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Volume:
84
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.02.029
Date:
June, 2013
File:
PDF, 807 KB
english, 2013
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