Comparative studies on electrical bias temperature...

Solid-State Electronics 2013 / 11 Vol. 89

Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations

Ryu, Min-Ki, Ko Park, Sang-Hee, Hwang, Chi-Sun, Yoon, Sung-Min
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
89
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.08.008
Date:
November, 2013
File:
PDF, 1.36 MB
english, 2013
Conversion to is in progress
Conversion to is failed