FTIR-ATR spectroscopy in thin film studies: The importance of sampling depth and deposition substrate
Laroche, G., Fitremann, J., Gherardi, N.Volume:
273
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.02.095
Date:
May, 2013
File:
PDF, 547 KB
english, 2013