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3DComplete: Efficient completeness inspection using a 2.5D color scanner
So, Edmond Wai Yan, Munaro, Matteo, Michieletto, Stefano, Tonello, Stefano, Menegatti, EmanueleVolume:
64
Language:
english
Journal:
Computers in Industry
DOI:
10.1016/j.compind.2013.03.014
Date:
December, 2013
File:
PDF, 11.27 MB
english, 2013