Stress and interfacial defects induced by amorphous carbon film growth on silicon
Macchi, C., Mariazzi, S., Zecca, A., Karwasz, G.P., Brusa, R.S., Laidani, N., Bartali, R., Gottardi, G., Anderle, M.Volume:
14
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2004.10.010
Date:
March, 2005
File:
PDF, 317 KB
english, 2005