Stress and interfacial defects induced by amorphous carbon...

Stress and interfacial defects induced by amorphous carbon film growth on silicon

Macchi, C., Mariazzi, S., Zecca, A., Karwasz, G.P., Brusa, R.S., Laidani, N., Bartali, R., Gottardi, G., Anderle, M.
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Volume:
14
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2004.10.010
Date:
March, 2005
File:
PDF, 317 KB
english, 2005
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