Impact of local back biasing on performance in hybrid...

Solid-State Electronics 2013 / 10 Vol. 88

Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology

Fenouillet-Beranger, C., Perreau, P., Benoist, T., Richier, C., Haendler, S., Pradelle, J., Bustos, J., Brun, P., Tosti, L., Weber, O., Andrieu, F., Orlando, B., Pellissier-Tanon, D., Abbate, F., Rich
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Volume:
88
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.04.008
Date:
October, 2013
File:
PDF, 3.02 MB
english, 2013
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