A theoretical study of the electronic structure for twin...

Solid State Communications 1987 Vol. 62; Iss. 2

A theoretical study of the electronic structure for twin stacking faults in silicon

Gong Xin-gao, Zheng Qing-qi, Han Ru-shan, Yang Wei-sheng
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Volume:
62
Year:
1987
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(87)91113-6
File:
PDF, 244 KB
english, 1987
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