![](/img/cover-not-exists.png)
Effect of weak uniform frustration on the resistive transition in a Josephson junction array
John P. Carini, Sidney R. Nagel, Riccardo Levi-Setti, Yuh-Lin Wang, Jan Chabala, Geoffrey CrowVolume:
65
Year:
1988
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(88)90741-7
File:
PDF, 367 KB
english, 1988