Nondestructive mapping of chemical composition and...

Thin Solid Films 2013 / 08 Vol. 541

Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction

Bonanno, P.L., Gautier, S., Gmili, Y.El., Moudakir, T., Sirenko, A.A., Kazimirov, A., Cai, Z.-H., Martin, J., Goh, W.H., Martinez, A., Ramdane, A., Le Gratiet, L., Maloufi, N., Assouar, M.B., Ougazzad
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Volume:
541
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.12.099
Date:
August, 2013
File:
PDF, 851 KB
english, 2013
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