X-ray diffraction study of amorphization along interfaces in polycrystalline Ni/Ti multilayers
M. Bouhki, A. Bruson, P. GuilminVolume:
83
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0038-1098(92)90003-r
File:
PDF, 302 KB
english, 1992