Suppression of interfacial boron accumulation and defect...

Suppression of interfacial boron accumulation and defect density in molecular beam epitaxial silicon

Dawei Gong, Xin Wei, Fang Lu, Qinhua Wang, Henghui Sun, Xun Wang
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Volume:
88
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0038-1098(93)90634-y
File:
PDF, 264 KB
english, 1993
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