High-angular resolution x-ray photoelectron diffraction measurements of Si(111)
C. Pirri, U. Kafader, G. Gewinner, P. WetzelVolume:
89
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0038-1098(94)90590-8
File:
PDF, 386 KB
english, 1994