Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments
C.T. Sah, L. Forbes, L.L. Rosier, A.F. Tasch Jr.Volume:
13
Year:
1970
Language:
english
Pages:
30
DOI:
10.1016/0038-1101(70)90064-x
File:
PDF, 2.35 MB
english, 1970