Longitudinal course of psychometric deviance in offspring of schizophrenic probands: Evidence from the New York high-risk project
Moldin, S.O., Gottesman, I.I., Erlenmeyer-Kimling, L.Volume:
15
Year:
1995
Language:
english
DOI:
10.1016/0920-9964(95)95140-5
File:
PDF, 198 KB
english, 1995