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Static characteristics of the metal-insulator-semiconductor- insulator-metal (MISIM) structure—II. Low frequency capacitance
Z. Djurić, M. Smiljanić, D. TjapkinVolume:
18
Year:
1975
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(75)90002-7
File:
PDF, 412 KB
english, 1975