Modeling and characterization of thermally induced skew on...

Microelectronics Journal 2013 / 11 Vol. 44; Iss. 11

Modeling and characterization of thermally induced skew on clock distribution networks of nanometric ICs

Sassone, Alessandro, Liu, Wei, Calimera, Andrea, Macii, Alberto, Macii, Enrico, Poncino, Massimo
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Volume:
44
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2012.07.007
Date:
November, 2013
File:
PDF, 662 KB
english, 2013
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