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Investigation of surface traps at the silicon-silicon monooxide interface by the C-V method
L.I. Popova, B.Z. Antov, P.K. VitanovVolume:
18
Year:
1975
Language:
english
Pages:
2
DOI:
10.1016/0038-1101(75)90181-1
File:
PDF, 171 KB
english, 1975