The effects of radiation damage on the properties of Ni-nGaAs Schottky diodes—I: Characterisation of defect levels
Paul D. Taylor, D.Vernon MorganVolume:
19
Year:
1976
Language:
english
Pages:
7
DOI:
10.1016/0038-1101(76)90010-1
File:
PDF, 650 KB
english, 1976