Influence of the depth of interface states into the...

Influence of the depth of interface states into the insulator on the noise properties of MOS transistors

P. Viktorovitch, P. Gentil
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
22
Year:
1979
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(79)90165-5
File:
PDF, 207 KB
english, 1979
Conversion to is in progress
Conversion to is failed