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Interpretation of C-V measurements for determining the doping profile in semiconductors
G. Baccarani, M. Rudan, G. Spadini, H. Maes, W. Vandervorst, R. Van OverstraetenVolume:
23
Year:
1980
Language:
english
Pages:
7
DOI:
10.1016/0038-1101(80)90169-0
File:
PDF, 657 KB
english, 1980