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Resistance associated with measurements of capacitance in electric double layers
Aoki, Koichi, Hou, Yongdan, Chen, Jingyuan, Nishiumi, ToyohikoVolume:
689
Language:
english
Journal:
Journal of Electroanalytical Chemistry
DOI:
10.1016/j.jelechem.2012.10.004
Date:
January, 2013
File:
PDF, 580 KB
english, 2013