Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces
C. Raisin, E. Vieujot-Testemale, A.Ben Brahim, J.M. Palau, L. LassabatereVolume:
27
Year:
1984
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(84)90147-3
File:
PDF, 389 KB
english, 1984