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Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's
Hon-Sum Wong, Marvin H. White, Thomas J. Krutsick, Richard V. BoothVolume:
30
Year:
1987
Language:
english
Pages:
16
DOI:
10.1016/0038-1101(87)90132-8
File:
PDF, 2.25 MB
english, 1987