The voltage pulse degraded Ti/4H–SiC Schottky diodes...

Diamond and Related Materials 2007 / 1 Vol. 16; Iss. 1

The voltage pulse degraded Ti/4H–SiC Schottky diodes studied with I–V and low frequency noise measurements

Hadži-Vuković, Jovan M., Jevtić, Milan M.
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Volume:
16
Language:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/j.diamond.2006.03.016
Date:
January, 2007
File:
PDF, 1.52 MB
english, 2007
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