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On the temperature dependence of the Hooge parameter αH in n and p-channel silicon JFETs
A.H. Pawlikiewicz, A. van der Ziel, G.S. Kousik, C.M. Van VlietVolume:
31
Year:
1988
Language:
english
Pages:
4
DOI:
10.1016/0038-1101(88)90133-5
File:
PDF, 382 KB
english, 1988