A method for MOSFET parameter extraction at very low...

Solid-State Electronics 1989 Vol. 32; Iss. 3

A method for MOSFET parameter extraction at very low temperature

Gerard Ghibaudo, Francis Balestra
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Volume:
32
Year:
1989
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(89)90095-6
File:
PDF, 221 KB
english, 1989
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