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Photo-induced current measurement for the characterized of deep-level traps in lattice-matched MODFETs on InP substrate
Roberto Sung, Mukunda B. DasVolume:
35
Year:
1992
Language:
english
Pages:
9
DOI:
10.1016/0038-1101(92)90014-4
File:
PDF, 609 KB
english, 1992