A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon
Mats Rosling, Henry Bleichner, Måns Lundqvist, Edvard NordlanderVolume:
35
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(92)90153-4
File:
PDF, 338 KB
english, 1992