Measurement considerations for zero-field time-of-flight studies of minority carrier diffusion in III–V semiconductors
M.L. Lovejoy, M.R. Melloch, R.K. Ahrenkiel, M.S. LundstromVolume:
35
Year:
1992
Language:
english
Pages:
9
DOI:
10.1016/0038-1101(92)90229-6
File:
PDF, 844 KB
english, 1992