Measurement of the resistance of metal-semiconductor-metal structures using the geometrical magnetoresistance technique
Andrzej Wolkenberg, Tomasz Przesławski, Jerzy KlamkaVolume:
35
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(92)90305-v
File:
PDF, 303 KB
english, 1992