A new method for measuring the saturation velocity of...

A new method for measuring the saturation velocity of submicron CMOS transistors

R.J. Schreutelkamp, L. Deferm
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Volume:
38
Year:
1995
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(94)00180-n
File:
PDF, 253 KB
english, 1995
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